| WIPO/PCT/KGL/18/T1 | English | Topic 1 - Introduction to the Patent System and Challenges Facing Developing Countries |  |
| WIPO/PCT/KGL/18/T2 | English | Topic 2 - WIPO and the International Patent System: The PCT at the Center of the International Patent System - General Overview, Advantages for Offices and Applicants, Statistics | |
| WIPO/PCT/KGL/18/T3 | English | Topic 3 - ARIPO and the Regional Patent System - An Overview | |
| WIPO/PCT/KGL/18/T4 | English | Topic 4 - Introduction to the Japan Patent Office (JPO) and its Function as a Receiving Office under the PCT | |
| WIPO/PCT/KGL/18/T6.1 | English | Topic 6 - International Search and Preliminary Examination under the PCT - The Experience of JPO (Part 1) | |
| WIPO/PCT/KGL/18/T6.2 | English | Topic 6 - International Search and Preliminary Examination under the PCT - The Experience of JPO (Part 2) | |
| WIPO/PCT/KGL/18/T7 T8 | English | Topic 7 & 8 - The PCT as a Source of Patent Information - Introduction to PATENTSCOPE & PATENTSCOPE: How to Perform a Search, Translate Functionalities, Result List, IPC Cat | |
| WIPO/PCT/KGL/18/T9 | English | Topic 9 - Processing of ARIPO Applications | |
| WIPO/PCT/KGL/18/T10 | English | Topic 10 - ARIPO Patent Statistics | |
| WIPO/PCT/KGL/18/T12 | English | Topic 12 - PATENTSCOPE - Practical Exercises | |