Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo
رمز الوثيقة | SCT/IS/ID/GE/17/INF/2 |
الاجتماعات ذات الصلة | SCT/IS/ID/GE/17 |
تاريخ النشر | 3 نوفمبر 2017 |
English | Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo |