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Topic 1: Challenges and Options in Patent Examination

Document CodeOMPI/PI/YAO/13/WWW/228403
Related Meeting(s)OMPI/PI/YAO/13
Publication DateJanuary 21, 2013
EnglishTopic 1: Challenges and Options in Patent Examination

Mr. Lutz Mailänder, Head, Patent Information Section, Global Information Service, Global Infrastructure Sector, WIPO

Complete document
Topic 1: Challenges and Options in Patent Examination, single (pdf)
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