Topic 1: Challenges and Options in Patent Examination
Código de los documentos | OMPI/PI/YAO/13/WWW/228403 |
Reuniones conexos | OMPI/PI/YAO/13 |
Fecha de publicación | 21 de enero de 2013 |
English | Topic 1: Challenges and Options in Patent Examination Mr. Lutz Mailänder, Head, Patent Information Section, Global Information Service, Global Infrastructure Sector, WIPO |