Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo
Código de los documentos | SCT/IS/ID/GE/17/INF/2 |
Reuniones conexos | SCT/IS/ID/GE/17 |
Fecha de publicación | 3 de noviembre de 2017 |
English | Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo |