Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo
文件编号 | SCT/IS/ID/GE/17/INF/2 |
相关会议 | SCT/IS/ID/GE/17 |
发布日期 | 2017年11月3日 |
English | Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo |