Topic 3 - A Framework of Technical Competencies and its Use for Assessments of Patent Examiners
文件编号 | WIPO/IP/DAE/18/T3 |
相关会议 | WIPO/IP/DAE/18 |
发布日期 | 2018年5月9日 |
English | Topic 3 - A Framework of Technical Competencies and its Use for Assessments of Patent Examiners |